Characterization of CMOS Active Pixel Sensors for particle detection: Beam test of the four sensors RAPS03 stacked system.
In this work, in order to check the suitability of CMOS Active Pixel Sensors (APS) detectors for vertexing/tracking applications ,four stacked CMOS APS sensors featuring 256x256 pixels with10x10 mm2 size have been tested at the INFN Beam Test Facility (BFT), Frascati (Rome).
For this purpose, a
dedicated mechanical and
electrical setup has been
devised and implemented,
allowing for the simultaneous
read-out of four sensors arranged
in a stacked structure. A
compact and fast system (up to
64MHz read-out clock) based on
external ADCs and FPGA allows
for the PC communication through
results in terms of track
reconstructions of electrons of
different energies (up to 496
MeV) are presented. This work
has been carried out within the
framework of the SHARPS project,
supported by INFN.
D. Passeri et al., Characterization of CMOS Active Pixel Sensors for particle detection: Beam test of the four sensors RAPS03 stacked system, Nucl. Instr. and Meth. A 617 (2010) 573–575