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Scientific lectures

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  2. Particle detector
  3. Interaction particle matter
  • Straggling Function
    Energy loss

    The Energy Loss distribution of charged particles for thin silicon layer.

  • landau distribution
    Landau function

    The Landau distribution for ionizing particles.

  • lifetime silicon
    Carrier lifetime

    Lifetime in silicon wafer. Bulk and surface recombination process.

  • The interaction of photons with the matter
    The interaction of photons

    The interaction of photons with the matter.

  • Multiple scattering
    Multiple scattering

    Multiple scattering for particles in the matter.

  • Radiation damage
    Radiation damage

    Radiation damage for silicon detectors.

  • spatial resolution
    Spatial resolution

    Spatial resolution in detection of ionizing particles for silicon sensors.

  • Active pixel sensor
    Active Pixel Sensors

    Active Pixel Sensors (APS) for the detection of ionizing particles.

  • ccd vs Cmos sensor
    APS vs CCD

    CMOS Active Pixel Sensor vs CCD. Performance comparison.

  • detector noise
    Noise analysis

    Noise analysis of particle sensors and pixel detectors.

  • cmos epi layer
    APS epi-layer

    CMOS Active Pixel Sensor with and without epitaxial layer.

  • diamond detector
    Diamond detector

    Diamond sensors for particle detector applications.

  • Czochralski vs Float Zone
    Czochralski vs Float Zone

    Two growth techniques for mono-crystalline silicon.

  • cross section
    The cross section

    The cross section for silicon particle detector.

  • Vertical scale integration
    Vertical Scale Integration

    Vertical Scale Integration for pixel detectors.

  • charge carrier generation
    Charge carrier generation

    Energy for charge carrier generation in semiconductor material.

  • nybrid pixel detector
    Hybrid Pixel Detectors

    Hybrid Pixel Detectors for particles detection.

 

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  • Energy loss in silicon
  • The new diamond detector
  • The CMOS active pixel sensor
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