In this work, in order to check the
suitability of CMOS Active Pixel Sensors
(APS) detectors for vertexing/tracking
applications ,four stacked CMOS APS
256x256 pixels with10x10 mm2 size have been
tested at the INFN Beam Test Facility (BFT),
For this purpose, a dedicated mechanical and electrical setup has been devised and implemented, allowing for the simultaneous read-out of four sensors arranged in a stacked structure. A compact and fast system (up to 64MHz read-out clock) based on external ADCs and FPGA allows for the PC communication through USB2.0.
results in terms of track reconstructions of
electrons of different energies (up to 496
MeV) are presented. This work has been
carried out within the framework of the
SHARPS project, supported by INFN.
D. Passeri et al., Characterization of CMOS Active Pixel Sensors for particle detection: Beam test of the four sensors RAPS03 stacked system, Nucl. Instr. and Meth. A 617 (2010) 573–575